Data presentation! "Basics of AFM/SPM Probes"
Introducing the probes used in scanning probe microscopy and atomic force microscopy! We will clearly explain the names of each part of the probe!
This document explains the probes used in scanning probe microscopy and atomic force microscopy. The probes used for measurements are consumables, and many types are available for different measurement needs. They are typically made of silicon or silicon nitride and are manufactured using semiconductor processes. Additionally, quartz material probes from the "qp series" are available from NanoSensors. 【Contents】 ■ Names of each part ■ Variations of tips (probes) ■ Variations of cantilevers (spring plates) ■ Variations of support tips ■ Variations of coatings *For more details, please refer to the PDF document or feel free to contact us.
- Company：NanoAndMoreジャパン 本社
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